Methods to control exposure rates in computerized adaptive tests

Authors

  • Javier Revuelta Universidad Autónoma de Madrid
  • Vicente Ponsoda Universidad Autónoma de Madrid
  • Julio Olea Universidad Autónoma de Madrid

DOI:

https://doi.org/10.7203/relieve.4.2.7210

Keywords:

computerized adaptive tests

Abstract

Three new item exposure control methods for computerized adaptive tests are introduced. The first one is based on maximum information, and adds a random component to the information provided by each item. The second one directly controls the exposure of each item, and applies only the items with and exposure lower than some arbitrary value. The third method is a mixture of the other two.
The three methods, plus maximum information and the Sympson and Hetter method, are compared in a simulation study, with respect to test precision and exposure rate. Finally, we comment some future research lines.

References

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Issue

Section

Research Articles